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Architecture of Embedded Systems

Subcategories:

Modeling of digital equipment technical equipment

Annotation:
For the description of the technical equipment, means are used to describe the algorithms that the technical equipment implements. The candidate will get acquainted with the basic theoretical approaches to describing the structures of the technical equipment. Modeling of technical equipment solves problems by optimizing both the performance and the speed of implementation of the proposed functions and, last but not least, the synchronization of parallel implementations of implied and system sub-functions.

Warp:
Introduction to Verilog Design of Logic Circuits, Design of Digital Circuits Based on Combinational and Sequential Circuit Models, Synthesis of Combination and Sequential Circuits, Design and Synthesis of Controllers, Programmable Logic Circuits and Memory Circuits, Algorithms and Architecture of Digital Processors, Arithmetic Processor Architecture, Tasks reverse synthesis of circuits.

Basic study material:
  • John F. Wakerly: Digital Design Principles and Practices 4th Edition. Pearson Prentice Hall 2006.
    ISBN 0-13-186389-4
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature:
  • Michael D. Ciletti: Advanced Digital Design Verilog HDL. Prentice-Hal "Inc. 2003. ISBN 978-0136019282
  • Mark Zwolinski: Digital System Design with VHDL. Pearson Education Limited 2004. ISBN 978-0130399854
  • Donald E. Thomas, Philip R. Moorby: The Verilog hardware description language. Springer, 2002
  • ALTERA: Advanced VHDL Design Techniques. WEB sources of the ALTERA company
  • Lucio Di Jasio and Coll .: PIC Microcontrollers: Know It All. Elsevier 2007. ISBN: 978-0-7506-8615-0
  • Tim Wilmshurst: Embedded Systems Design with PIC Microcontrollers, Principles and Applications. Eseveier 2007. ISBN 978-0-7506-6755-5

Design of fail-safe systems

Annotation:
There are absolutely no reliable systems. The possibility of a malfunction is a basic feature of digital systems. When designing digital systems, it is necessary to design such a structure to ensure that failure does not cause a fatal failure of the digital system as a whole.

Warp:
Fundamentals of Fault Resistance, Fundamentals of Coding Theory, Configuration of Resistant Fault Systems, Modeling of Troubled Systems, Testing of Embedded Modules and Systems, Redundancy Models - Repairs, N-Multiple Backups, Reliability of Software and Techniques Restoration Techniques.

Basic study material:
  • Parag K. Lala: Self-Checking and Fault Tolerant Digital Design. Morgan Kaufmann Publishers Inc. 2001. ISBN: 0-12-434370-8
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature:
  • Shooman ML: Reliability of Computer Systems and Networks - Fault Tolerance, Analysis and Design. Wiley Interscience, 2002. ISBN 0-471-29342-3
  • Pankaj Jalote: Fault Tolerant in Distributed Systems. Prentice-Hall. 1994. ISBN: 0-13-301367-7
  • Laung-Terng Wang, Charles E. Stroud, Nur A. Touba: System-on-chip Test Architectures. Elsevier Inc. 2008. ISBN 978-0-12-373973-5
  • Dhiraj Pradhan: Fault-Tolerant Computer System Design. Prentice-Hall, first edition, 1996. ISBN: 0-13-057887-8

Reliability of digital systems

Annotation:
Students will learn the basics of reliability theory and its application to digital systems. Modeling the behavior of digital systems gives an idea of ​​the behavior of the system during its lifetime. The modeling of the servicing systems allows to describe both the reliability characteristics of individual parts of the system as well as the processes of repairing the technical equipment and the processes of regeneration of the system after an error or degradation of structure or performance.

Warp:
Introduction to Reliability Theory, Fundamentals of Testing and Language Ranges for Digital Circuit Modeling, Verilog Testing, Error and Fault Modeling, Fault Simulation and their Applications, Fault Simulation Methods, Test Steps Algorithms, Deterministic Test Generation Algorithms, Test Design and Resources Monitoring, IEEE Standard for Digital Circuit Testing, Built-in Self-Testing Devices, Test Compression, Memory Testing, and Built-in Self-Testing Memory Devices.

Basic study material:
  • Zainalabedin Navabi: Digital System Test and Testab Design. Springer, 2010. ISBN 978-1-4419-7547-8
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature:
  • Shooman ML: Reliability of Computer Systems and Networks - Fault Tolerance, Analysis and Design. Wiley Interscience, 2002. ISBN 0-471-29342-3
  • Sheldon M. Ross: Introduction to Probability Models. Academic Press, Inc. 1985. ISBN: 978-0-12-381445-6
  • Trivedi K .: Probability and Statistics with Reliability. Queuing, and Computer Science Applications. John Wiley and Sons, New Edition, 2001. ISBN: 978-0-471-33341-8
  • Robin A. Sahner, Kishor Trivedi, Antonio Puliafito: Performance and Reliability Analysis of Computer Systems. Kluwer Academic Publishers. 2012. ISBN: 146 136 0056 (978 146 136 005 6)
  • Daniel P. Siewiorek, Robert S. Swarz: The Theory and Practice of Reliable System Design. AK Peters, third edition. 1983. ISBN: 978-0932376176