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Architecture of Embedded Systems

Subcategories:

Modeling of digital equipment technical equipment

Annotation:
For the description of the technical equipment, means are used to describe the algorithms that the technical equipment implements. The candidate will get acquainted with the basic theoretical approaches to describing the structures of the technical equipment. Modeling of technical equipment solves problems by optimizing both the performance and the speed of implementation of the proposed functions and, last but not least, the synchronization of parallel implementations of implied and system sub-functions.

Warp:
Introduction to Verilog Design of Logic Circuits, Design of Digital Circuits Based on Combinational and Sequential Circuit Models, Synthesis of Combination and Sequential Circuits, Design and Synthesis of Controllers, Programmable Logic Circuits and Memory Circuits, Algorithms and Architecture of Digital Processors, Arithmetic Processor Architecture, Tasks reverse synthesis of circuits.

Basic study material:
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature:

Design of fail-safe systems

Annotation:
There are absolutely no reliable systems. The possibility of a malfunction is a basic feature of digital systems. When designing digital systems, it is necessary to design such a structure to ensure that failure does not cause a fatal failure of the digital system as a whole.

Warp:
Fundamentals of Fault Resistance, Fundamentals of Coding Theory, Configuration of Resistant Fault Systems, Modeling of Troubled Systems, Testing of Embedded Modules and Systems, Redundancy Models - Repairs, N-Multiple Backups, Reliability of Software and Techniques Restoration Techniques.

Basic study material:
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature:

Reliability of digital systems

Annotation:
Students will learn the basics of reliability theory and its application to digital systems. Modeling the behavior of digital systems gives an idea of ​​the behavior of the system during its lifetime. The modeling of the servicing systems allows to describe both the reliability characteristics of individual parts of the system as well as the processes of repairing the technical equipment and the processes of regeneration of the system after an error or degradation of structure or performance.

Warp:
Introduction to Reliability Theory, Fundamentals of Testing and Language Ranges for Digital Circuit Modeling, Verilog Testing, Error and Fault Modeling, Fault Simulation and their Applications, Fault Simulation Methods, Test Steps Algorithms, Deterministic Test Generation Algorithms, Test Design and Resources Monitoring, IEEE Standard for Digital Circuit Testing, Built-in Self-Testing Devices, Test Compression, Memory Testing, and Built-in Self-Testing Memory Devices.

Basic study material:
Examiner:
prof. Ing. Václav Přenosil, CSc., Doc. Ing. Pavel Čeleda, Ph.D.

Other Recommended Literature: